Products & Services


    
Test Wafers

    
Analysis Software
    
> ChampiAn
    
> ChampiSim

    
Metrology Service

    Defect Characterization
    & E-Testing Services

 


 

 



Building on the CMP research and models developed at MIT, SKW has created its own CMP process analysis software ChampiAn which includes Oxide, STI and metal CMP process modules.

SKW's ultimate goal is to create a comprehensive CMP software toolset:

ChampiAn for model based production analysis
ChampiSim for CMP simulation
ChampiDF for layout modification and improvement
ChampiPC for process control on chip production lines.


 
 

SKW Associates, Inc.