Products & Services

Test Wafers

Analysis Software
> ChampiAn
> ChampiSim

Metrology Service

    Defect Characterization
    & E-Testing Services




Building on the CMP research and models developed at MIT, SKW has created its own CMP process analysis software ChampiAn which includes Oxide, STI and metal CMP process modules.

SKW's ultimate goal is to create a comprehensive CMP software toolset:

ChampiAn for model based production analysis
ChampiSim for CMP simulation
ChampiDF for layout modification and improvement
ChampiPC for process control on chip production lines.


SKW Associates, Inc.